供应HP4291A抗阻分析仪

阻抗分析仪：hp4291a

频率范围：1m—1000m
主要用途
测试材料的阻抗z，导纳y，电感l，电阻r，介电损耗d，品质因数
射频阻抗计量器具检定系统

Hewlett Packard 4291A
RF Impedance Analyzer, Refurbished
 
       Basic accuracy ± 0.8%

       Advanced calibration and error compensation

       Four component test fixtures (DUT size: 0.5 mm to 20 mm)

       Independent parameter selection in 2 channels

       Direct read-out permittivity, permeability

       Two material fixtures (operating temperature: -55° to +200°C)

       Versatile analysis (temperature, cole-cole plot, relaxation time)

       Swept parameters (frequency, ac level, dc bias, temperature)

       Opti***:
 16091A - Coaxial Test Fixture
 16092A - Spring Clip Test Fixture
 16093A - Binding Post Test Fixture
 16093B - Binding Post Test Fixture
 16094A - Probe Fixture
 002 - 100Hz/200Hz resolution synthesizer
 004 - Recorder Outputs
 
Hewlett Packard 4291A Shown
 
HP 4291A impedance/material analyzer provides a total solution for high-accuracy and easy measurement of surface-mount components and dielectric/magnetic materials.  The 4291A uses a direct current-voltage measurement technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range.  Basic impedance accuracy is ± 0.8%.  High Q accuracy enables low-loss component analysis.  An internal synthesizer sweeps frequency from 1 MHz to 1.8 GHz with 1 mHz resolution.  A 1.8 m error-less cable connects the analyzer to a test station so you can extend your test point away from the analyzer without losing accuracy.  Advanced calibration and error compensation function eliminate measurement error factors in fixtures and assure high accuracy and repeatability at DUT/MUT.

The 4291A also provides automatic level control and monitor of test signals by using I-BASIC programming function; devices can be measured under a c***tant voltage or current.  Measure bias-dependent impedance characteristics with optional dc bias (up to 40V and 100mA).  At the push of a button, the built-in Equivalent Circuit Analysis Function automatically calculates the circuit c***tant values of five circuit models (similar to 4194A's Equivalent Circuit Analysis Function.)

The 4291A has two measurement channels; each channel can be set to measure a single (e.g., Z) or dual (e.g., Z-theta) impedance parameter.  The color CRT with split-display can show both active traces and memory traces (stored in RAM).  A built-in floppy disk drive stores programs and test data in either LIF or MS-DOS format.

With optional IBASIC (Opt 1C2), you can control external test equipment such as a temperature chamber or wafer prober directly from the 4291A.  You do not need a separate instrument controller.  Opt 1C2 gives you a keyboard and the HP IBASIC programming language for test automation and integration.

Material Evaluation

The 4291A enables easy and sophisticated material evaluation and improves material evaluation quality and efficiency.  The 4291A provides the total dielectric/magnetic material measurement soluti*** in wide frequency range (1 MHz to 1.8 GHz).

Key Features

       Direct material parameters read-out (permitivity, permeability)

       Material analysis functi*** (cole-cole plots, relaxation time analysis)

       Versatile evaluation using a variety of swept parameters (frequency, signal level, temperature, etc.)

Test Fixtures

Select from four types of component test fixtures: 16191A, 16192A, 16193A, and 16194A.  These test fixtures directly connect to the test station's APC7 connector.  Each fixture is designed for a different component size range, from 0.5 mm to 20 mm, and can handle different types of termination.  These adjustable fixtures simplify device connection.  For temperature coefficient testing, the 16194A high-temperature component test fixture can be used in a temperature oven from -55° to +200°C.  Together with the 4291A's built-in compensation software,  the fixtures ensure impedance accuracy and measurement repeatability.  The 16453A dielectric material test fixture and 16454A magnetic material test fixture improve the accuracy and ease of use for permittivity or permeability measurements.  These material fixtures h***e wide operating temperature of -55° to +200°C.

For measuring thin-film devices and semiconductors, the 4291A easily interfaces to a wafer prober.  An extension cable connects the 4291A's test head to a probe station.  For temperature and humidity testing, the 4291A can control an external temperature/humidity chamber via HP-IB and display the measurement result vs. temperature or humidity.

Ease of Use

With the 4291A, impedance testing is easy.  The analyzer comes with on-line calibration and compensation routine to simplify the task.  Markers and limit-line function offer quick data analysis.