Agilent安捷伦N7788A/N7788D光学组件分析仪谭艳飞13510075188
深圳仪信电子科技有限公司
深圳佳华泰电子科技有限公司
联系人:谭艳飞（总经理）——蒋S（特助）
手机: 谭S 135-1007-5188
技术咨询：蒋工135-1007-5288
电 话：0755-21502766 传 真：0755-21502722
客 服***：53540923 /
邮 箱：yixin1718@
网 址：http://
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地址：深圳市龙华新区油松路天汇大厦A栋408
Key Benefits
- Highest Accuracy in a single sweep: no ***eraging over multiple sweeps required
- High measurement speed
- Complete measurement across C/L-band in less than 10 seconds (no need to wait for many ***erages)
- Robustness against fiber movement / vibration and drift
描述
Keysight Technologies pushes the limits of component measurements with the N7788A Component Analyzer. Its proprietary technology is comparable with the well-known Jones-Matrix-Eigenanalysis (JME) which is the standard method for measuring Polarization Mode Dispersion (PMD) or differential group delay (DGD) of optical devices.
Keysight’s new single scan technology offers a range of advantages to test a complete set of parameters:
- DGD/ PMD
- PDL
- Power / Loss
- TE / TM-Loss
- 2nd-order PMD
- Principal States of Polarization (PSPs)
- Jones and Mueller Matrices